Coating Thickness Measurement

Axiom, based on X-ray fluorescence(XRF), is the user friendly bench top instruments designed for material analysis and coating thickness measurements. The Xray source and detector assembly is located in the instruments’ upper chamber with motorizes Z axis movement which ensures the ease of measurement. The integrated video microscope with zoom and crosshair simplifies sample placement and allows for a precise measuring spot adjustment. The entire operation and evaluation as well as clear presentation of measurement data is performed on PC using simple and very user friendly interface on Software.